Call For Paper Volume:7 Issue:1 Jan'2020 |

New Technology for Memory Tests Design

Publication Date : 30/07/2015

Author(s) :

Vladimir Ryabtsev , MUDAR ALMADI.

Volume/Issue :
Volume 2
Issue 7
(07 - 2015)

Abstract :

Multi-valued transformations of the incidence matrix of addresses transitions graphs that reduce the complexity of the design of micro U-Y-schemes of memory’s algorithms diagnostic tests are proposed. The algorithm of test MATS ++, suitable for further synthesis programming language Prover is presented.

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New Technology for Memory Tests Design

July 28, 2015