Call For Paper Volume:4 Issue:8 Aug'2017 |

New Technology for Memory Tests Design

Publication Date : 30/07/2015



Author(s) :

Vladimir Ryabtsev , MUDAR ALMADI.


Volume/Issue :
Volume 2
,
Issue 7
(07 - 2015)



Abstract :

Multi-valued transformations of the incidence matrix of addresses transitions graphs that reduce the complexity of the design of micro U-Y-schemes of memory’s algorithms diagnostic tests are proposed. The algorithm of test MATS ++, suitable for further synthesis programming language Prover is presented.


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New Technology for Memory Tests Design

July 28, 2015