Call For Paper Volume:4 Issue:8 Aug'2017 |

Automatic generation of software based self test programs for VLIW processors

Publication Date : 28/02/2015



Author(s) :

S.Maniyarasan , D.Sathyakala.


Volume/Issue :
Volume 2
,
Issue 2
(02 - 2015)



Abstract :

Software-Based Self-Test (SBST) approaches are the effective solution to detect permanent faults at the end of both the production process and during the operational phase, when Very Long Instruction Word (VLIW) processors are used these techniques require some optimization steps in order to properly exploit the parallelism intrinsic in these architectures. In this paper we present a new method from previously known algorithms and automatically generates an effective test program which can produce   high fault coverage on the VLIW processor under test, by reducing the test code size which on effect reduces the test duration. The method consists of four stages of parametric phases and can deal with different VLIW processor models. The main aim of our proposed method is to automatically obtain a test program able to achieve high fault coverage with minimum test time and the required resources. Experimental data gathered shows effectiveness of the proposed approach that this method is able to exploit the intrinsic parallelism of the VLIW processor, reducing the grow thin size, and duration of the test program when the processor size grows.


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Automatic generation of software based self test programs for VLIW processors

February 11, 2015